3D Microelectronics

Back

This document provides a summary of the activities undertaken on an ONR funded program at Northeastern University and Kopin Corporation to develop three dimensional microelectronics. As a demonstration vehicle we have chosen a 64 bit RISC microprocessor. Two interim goals are sought; a test chip to demonstrate the three dimensional technology capability with ring oscillators and gate delay chains. This chip is expected to be completed this year. Our second objective is a 32 bit RISC microprocessor. To achieve this goal, new design tools are needed. These are near completion and described within this document.

I) Introduction

Recent advances in integrated circuit technology have focused on reducing device sizes and increasing device speeds. As a result of these developments, circuit designers are able to boost the performance of their designs by 25% annually. While circuit speeds are increasing, the desire for increase functionality has resulted in increased die size. Interconnections between functional blocks require long lead lengths. This leads to a reduction in overall circuit speed. Our approach to increasing circuit speed while at the same time maintaining die size and increasing functionality is the utilization of three-dimensional (3-D) microelectronics. In this approach, multiple layers of devices are stacked on top of each other with insulating material between them. The advantages of the 3-D electronics approach are that:

The main objectives of the program are provided below.

II) 3D Process

Our technology takes advantage of the Transferred Circuits (TC) capabilities that have been developed by Kopin Corporation. Using the TC technique, circuits can be fabricated using standard bulk CMOS processing and then transferred from one wafer to another in thin film form. The transfer process allows alignment of the layers. At Northeastern, we are developing an interconnection technology that will allow layers to be electrically connected to one another. These interconnections are small and can be placed anywhere on the die. This unrestricted placement of interconnections gives our technology a unique advantage over other existing 3D techniques.

Our current work is aimed at the development of a two level circuit. In this case, a bulk silicon wafer is processed with half of the circuit. A second Silicon-on-Insulator (SOI) wafer is processed using standard CMOS fabrication techniques creating the second half of the circuit. The second wafer is manufactured on Isolated Silicon Epitaxy (ISE), Kopin Corporation's production Silicon-On-Insulator (SOI) technology. SOI consists of a bulk silicon substrate with a thin layer of single crystalline silicon on top and separated from the substrate by a silicon dioxide layer. The SOI wafer is used because the buried oxide layer acts as a etch-stop during a subsequent back-etch step. The SOI circuit will be transferred face down onto the top of the bulk wafer as shown in Figure 1.

Figure 1. Transfer process taking the device layer from the SOI wafer and bonding it to the top of a processed bulk silicon wafer.

An adhesive is used to bond the transferred circuit to the bulk silicon wafer. The result is the two layer 3-D circuit shown in Figure 2.

Figure 2. A simplified cross-sectional view of a 3-D circuit created using Kopin's circuit transfer technology.

Electrical connections need to be made between the two active device layers after the transfer. A major task in our 3-D program is the development of a process to make the electrical interconnection. A conceptual drawing of an interconnection is shown in figure 3 below. During the program, interconnection test structures have been fabricated and tested. Interconnections with vias as small as 10 microns square have been produce good results.

Figure 3. A cross-sectional view of a complete 3D circuit showing a bulk device, an SOI device and an interconnection.

The transfer technique has the following advantages over other 3D methods:

  • 1. The procedure is simple. The process uses conventional VLSI processes.
  • 2. Transfer is done at wafer scale, leading to potentially high production rates.
  • 3. The process is conducted at low temperatures, therefore devices will not be damaged during the transfer process.
  • 4. The capability of fabricating circuits with more than two layers is possible with multi-transfer steps.
  • Back
    Hosted by uCoz